
La titularidad de los derechos patrimoniales de esta obra pertenece a las instituciones editoras. Su uso se rige por una licencia Creative Commons BY-NC-ND 4.0 Internacional, https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.es, para un uso diferente consultar al responsable jurídico del repositorio por medio del correo electrónico rmf@ciencias.unam.mx.
Ver términos de la licenciaDANIEL, THOMAS OJONUGWA, et al. (2025). Synthesis and characterizaton of silver/silver oxide thin film via chemical bath deposition. Revista Mexicana de Física; Vol. 71 Núm. 1 Jan-Feb, 2025. Recuperado de https://repositorio.unam.mx/contenidos/4161244
Autor(es)
DANIEL, THOMAS OJONUGWA; Nwankwo, U.
Tipo
Artículo de Investigación
Área del conocimiento
Físico Matemáticas y Ciencias de la Tierra
Título
Synthesis and characterizaton of silver/silver oxide thin film via chemical bath deposition
Fecha
2025-01-01
Resumen
The chemical bath deposition technique was used to deposit Ag/AgO films on a glass substrate using silver nitrate (AgNO3) and triethanolamine (a polymer matrix) as the complexing agent. X-ray diffraction (XRD) was used to study the crystalline structure of the films, scanning electron microscopy (SEM) was used to study the micrograph/morphology, and energy dispersive spectroscopy (EDS) was used for elemental composition analysis. Four peaks at 2θ values of 38.05°, 44.15°, 64.31°, and 77.41° matched the (111), (200), (220), and (311) peaks, respectively, indicating that the obtained films were crystalline. The Ag/AgO films had a relatively low transmittance value of approximately 12% in the wavelength range of 300 to 1100 nm, a band gap energy of less than 2 eV, and a high absorbance of ≥ 80%, suggesting applications in photothermal, photoelectronic devices/systems, architectural coatings, and other areas where spectrally selective films are of interest.
Tema
Ag/AgO thin films; chemical bath deposition; characterisation; nanoparticle
Idioma
eng
ISSN
ISSN electrónico: 2683-2224; ISSN impreso: 0035-001X