dor_id: 45775

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351.#.#.b: Journal of Applied Research and Technology

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856.4.0.u: https://jart.icat.unam.mx/index.php/jart/article/view/160/157

100.1.#.a: Kuo, Jian Long; Cheng, Ming Te

524.#.#.a: Kuo, Jian Long, et al. (2014). Optimal Yield Rate in ACF Cutting Process of TFT-LCD Module Using Orthogonal Particle Swarm Optimization Based on Response Surface Design. Journal of Applied Research and Technology; Vol. 12 Núm. 6. Recuperado de https://repositorio.unam.mx/contenidos/45775

245.1.0.a: Optimal Yield Rate in ACF Cutting Process of TFT-LCD Module Using Orthogonal Particle Swarm Optimization Based on Response Surface Design

502.#.#.c: Universidad Nacional Autónoma de México

561.1.#.a: Instituto de Ciencias Aplicadas y Tecnología, UNAM

264.#.0.c: 2014

264.#.1.c: 2014-12-01

653.#.#.a: ACF cutting process; TFT-LCD; response surface method (RSM); plasma clean; orthogonal particle swarm optimization (OPSO)

506.1.#.a: La titularidad de los derechos patrimoniales de esta obra pertenece a las instituciones editoras. Su uso se rige por una licencia Creative Commons BY-NC-SA 4.0 Internacional, https://creativecommons.org/licenses/by-nc-sa/4.0/legalcode.es, para un uso diferente consultar al responsable jurídico del repositorio por medio del correo electrónico gabriel.ascanio@icat.unam.mx

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001.#.#.#: 074.oai:ojs2.localhost:article/160

041.#.7.h: eng

520.3.#.a: Anisotropic Conductive Film (ACF) is essential material in LCM (Liquid Crystal Module) process. It is used in bondingprocess to make the driving circuit conductive. Because the price of TFT-LCD is getting lower than before in recentyears, the ACF has relatively higher cost ratio. The conventional long bar ACF cutting unit is changed into short barACF cutting unit in new bonding technology. However, the new type machine was not optimized in process controland mechanical design. Therefore, the failure rate of new ACF cutting process is much higher than the one of theconventional process. This wastes the ACF material and rework cost is considerably large. How to make themanufacturing cost down effectively and promote the product quality is the main issue to maintain competitioncapability for the product. Therefore, the orthogonal particle swarm optimization (OPSO) is used to analyze theoptimal design problem. The ACF cutting yield rate is selected to be objective function for optimization. The qualitycharacteristic function for yield rate is used in orthogonal particle swarm optimization. Three control factors such asplasma clean speed, ACF peeling speed and ACF cutter spring setting are selected to study the effect of the yieldrate. Results show that the proposed method can provide good optimal solution to improve the ACF cutting processfor TFTLCD manufacturing process.

773.1.#.t: Journal of Applied Research and Technology; Vol. 12 Núm. 6

773.1.#.o: https://jart.icat.unam.mx/index.php/jart

022.#.#.a: ISSN electrónico: 2448-6736; ISSN: 1665-6423

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264.#.1.b: Instituto de Ciencias Aplicadas y Tecnología, UNAM

doi: https://doi.org/10.1016/S1665-6423(14)71675-X

harvesting_date: 2023-11-08 13:10:00.0

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last_modified: 2024-03-19 14:00:00

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Artículo

Optimal Yield Rate in ACF Cutting Process of TFT-LCD Module Using Orthogonal Particle Swarm Optimization Based on Response Surface Design

Kuo, Jian Long; Cheng, Ming Te

Instituto de Ciencias Aplicadas y Tecnología, UNAM, publicado en Journal of Applied Research and Technology, y cosechado de Revistas UNAM

Licencia de uso

Procedencia del contenido

Cita

Kuo, Jian Long, et al. (2014). Optimal Yield Rate in ACF Cutting Process of TFT-LCD Module Using Orthogonal Particle Swarm Optimization Based on Response Surface Design. Journal of Applied Research and Technology; Vol. 12 Núm. 6. Recuperado de https://repositorio.unam.mx/contenidos/45775

Descripción del recurso

Autor(es)
Kuo, Jian Long; Cheng, Ming Te
Tipo
Artículo de Investigación
Área del conocimiento
Ingenierías
Título
Optimal Yield Rate in ACF Cutting Process of TFT-LCD Module Using Orthogonal Particle Swarm Optimization Based on Response Surface Design
Fecha
2014-12-01
Resumen
Anisotropic Conductive Film (ACF) is essential material in LCM (Liquid Crystal Module) process. It is used in bondingprocess to make the driving circuit conductive. Because the price of TFT-LCD is getting lower than before in recentyears, the ACF has relatively higher cost ratio. The conventional long bar ACF cutting unit is changed into short barACF cutting unit in new bonding technology. However, the new type machine was not optimized in process controland mechanical design. Therefore, the failure rate of new ACF cutting process is much higher than the one of theconventional process. This wastes the ACF material and rework cost is considerably large. How to make themanufacturing cost down effectively and promote the product quality is the main issue to maintain competitioncapability for the product. Therefore, the orthogonal particle swarm optimization (OPSO) is used to analyze theoptimal design problem. The ACF cutting yield rate is selected to be objective function for optimization. The qualitycharacteristic function for yield rate is used in orthogonal particle swarm optimization. Three control factors such asplasma clean speed, ACF peeling speed and ACF cutter spring setting are selected to study the effect of the yieldrate. Results show that the proposed method can provide good optimal solution to improve the ACF cutting processfor TFTLCD manufacturing process.
Tema
ACF cutting process; TFT-LCD; response surface method (RSM); plasma clean; orthogonal particle swarm optimization (OPSO)
Idioma
eng
ISSN
ISSN electrónico: 2448-6736; ISSN: 1665-6423

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