dor_id: 4107433

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650.#.4.x: Físico Matemáticas y Ciencias de la Tierra

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351.#.#.a: Artículos

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856.4.0.u: https://rmf.smf.mx/ojs/rmf/article/view/4170/4137

100.1.#.a: Vásquez A, M. A.; Romero Paredes, G.; Andraca Adame, J. A.; Peña Sierra, R.

524.#.#.a: Vásquez A, M. A., et al. (2016). Fabrication and characterization of ZnO:Zn(n+)/Porous-Silicon/Si(p) heterojunctions for white light emitting diodes. Revista Mexicana de Física; Vol 62, No 1 Jan-Feb: 5-0. Recuperado de https://repositorio.unam.mx/contenidos/4107433

245.1.0.a: Fabrication and characterization of ZnO:Zn(n+)/Porous-Silicon/Si(p) heterojunctions for white light emitting diodes

502.#.#.c: Universidad Nacional Autónoma de México

561.1.#.a: Facultad de Ciencias, UNAM

264.#.0.c: 2016

264.#.1.c: 2016-01-01

653.#.#.a: Porous Silicon; ZnO:Zn(n) films; porous silicon-heterostructures; electrical characterization; electroluminescence

506.1.#.a: La titularidad de los derechos patrimoniales de esta obra pertenece a las instituciones editoras. Su uso se rige por una licencia Creative Commons BY-NC-ND 4.0 Internacional, https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.es, fecha de asignación de la licencia 2016-01-01, para un uso diferente consultar al responsable jurídico del repositorio por medio de rmf@ciencias.unam.mx

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001.#.#.#: oai:ojs.rmf.smf.mx:article/4170

041.#.7.h: eng

520.3.#.a: The fabrication and characterization of electroluminescent ZnO:Zn(n+ )/Porous Silicon/Si(p) heterojunctions is presented. Highly conductive ZnO films (ZnO:Zn(n+ )) were produced by applying a temperature annealing at 400\∘ C by 5 min to the ZnO/Zn/ZnO arrange formed by DC sputtering, and the Porous Silicon (PS) films were prepared on p-type (100) Si wafers by anodic etching. The ZnO:Zn(n+ )/PS/Si(p) heterojunction is accomplished by applying a brief temperature annealing stage to the entire ZnO/Zn/ZnO/PS/Si structure to preserve the PS luminescent characteristics. The ZnO:Zn(n+ ) films were characterized by X-ray diffraction and Hall-van der Pauw measurements. The PS and ZnO:Zn(n+ ) films were also studied by photoluminescence (PL) measurements. The current-voltage characteristics of the heterojunctions showed well defined rectifying behavior with a turn-on voltage of 1.5 V and ideality factor of 5.4. The high ideality factor is explained by the presence of electron tunneling transport aided by energy levels related to the defects at the heterojunction interface and into the PS film. The saturation current and the series resistance of the heterostructure were 4 \times 10-7A/cm 2 and 16 \Ω-cm2 , respectively. White color electroluminescence is easily observed at the naked eye when excited with square wave pulses of 8 V and 1 KHz.

773.1.#.t: Revista Mexicana de Física; Vol 62, No 1 Jan-Feb (2016): 5-0

773.1.#.o: https://rmf.smf.mx/ojs/rmf/index

046.#.#.j: 2020-11-25 00:00:00.000000

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handle: 41fe8c4e3539bdeb

harvesting_date: 2020-09-23 00:00:00.0

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last_modified: 2020-11-27 00:00:00

license_url: https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.es

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Artículo

Fabrication and characterization of ZnO:Zn(n+)/Porous-Silicon/Si(p) heterojunctions for white light emitting diodes

Vásquez A, M. A.; Romero Paredes, G.; Andraca Adame, J. A.; Peña Sierra, R.

Facultad de Ciencias, UNAM, publicado en Revista Mexicana de Física, y cosechado de Revistas UNAM

Licencia de uso

Procedencia del contenido

Entidad o dependencia
Facultad de Ciencias, UNAM
Revista
Repositorio
Contacto
Revistas UNAM. Dirección General de Publicaciones y Fomento Editorial, UNAM en revistas@unam.mx

Cita

Vásquez A, M. A., et al. (2016). Fabrication and characterization of ZnO:Zn(n+)/Porous-Silicon/Si(p) heterojunctions for white light emitting diodes. Revista Mexicana de Física; Vol 62, No 1 Jan-Feb: 5-0. Recuperado de https://repositorio.unam.mx/contenidos/4107433

Descripción del recurso

Autor(es)
Vásquez A, M. A.; Romero Paredes, G.; Andraca Adame, J. A.; Peña Sierra, R.
Tipo
Artículo de Investigación
Área del conocimiento
Físico Matemáticas y Ciencias de la Tierra
Título
Fabrication and characterization of ZnO:Zn(n+)/Porous-Silicon/Si(p) heterojunctions for white light emitting diodes
Fecha
2016-01-01
Resumen
The fabrication and characterization of electroluminescent ZnO:Zn(n+ )/Porous Silicon/Si(p) heterojunctions is presented. Highly conductive ZnO films (ZnO:Zn(n+ )) were produced by applying a temperature annealing at 400\∘ C by 5 min to the ZnO/Zn/ZnO arrange formed by DC sputtering, and the Porous Silicon (PS) films were prepared on p-type (100) Si wafers by anodic etching. The ZnO:Zn(n+ )/PS/Si(p) heterojunction is accomplished by applying a brief temperature annealing stage to the entire ZnO/Zn/ZnO/PS/Si structure to preserve the PS luminescent characteristics. The ZnO:Zn(n+ ) films were characterized by X-ray diffraction and Hall-van der Pauw measurements. The PS and ZnO:Zn(n+ ) films were also studied by photoluminescence (PL) measurements. The current-voltage characteristics of the heterojunctions showed well defined rectifying behavior with a turn-on voltage of 1.5 V and ideality factor of 5.4. The high ideality factor is explained by the presence of electron tunneling transport aided by energy levels related to the defects at the heterojunction interface and into the PS film. The saturation current and the series resistance of the heterostructure were 4 \times 10-7A/cm 2 and 16 \Ω-cm2 , respectively. White color electroluminescence is easily observed at the naked eye when excited with square wave pulses of 8 V and 1 KHz.
Tema
Porous Silicon; ZnO:Zn(n) films; porous silicon-heterostructures; electrical characterization; electroluminescence
Idioma
eng
ISSN
2683-2224 (digital); 0035-001X (impresa)

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