dor_id: 4107114

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856.4.0.u: https://rmf.smf.mx/ojs/rmf/article/view/4015/3982

100.1.#.a: Alarcón Flores, G.; Vásquez Pérez, B.; Peláez Rodríguez, A.; Villa Garcia, M.; Carmona Téllez, S.; A, J.; Falcon, C.; Aguilar Frutis, M.

524.#.#.a: Alarcón Flores, G., et al. (2013). Electrical and structural characteristics of spray deposited (ZnO)X-(CdO)1 - X thin films. Revista Mexicana de Física; Vol 59, No 5: 403-0. Recuperado de https://repositorio.unam.mx/contenidos/4107114

245.1.0.a: Electrical and structural characteristics of spray deposited (ZnO)X-(CdO)1 - X thin films

502.#.#.c: Universidad Nacional Autónoma de México

561.1.#.a: Facultad de Ciencias, UNAM

264.#.0.c: 2013

264.#.1.c: 2013-01-01

653.#.#.a: Impedance spectroscopy; transparent conducting oxides (tcos); spray pyrolysis

506.1.#.a: La titularidad de los derechos patrimoniales de esta obra pertenece a las instituciones editoras. Su uso se rige por una licencia Creative Commons BY-NC-ND 4.0 Internacional, https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.es, fecha de asignación de la licencia 2013-01-01, para un uso diferente consultar al responsable jurídico del repositorio por medio de rmf@ciencias.unam.mx

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041.#.7.h: eng

520.3.#.a: (ZnO) X (CdO) 1 - Xthin films were deposited on glass substrates at 300\∘ C and 400\∘ C by ultrasonic spray pyrolysis with compositions ranging from CdO to ZnO. The electrical properties were obtained by impedance spectroscopy and Hall Effect measurements. Scanning electron microscopy, energy dispersive spectroscopy, and X-ray diffraction, were used to study the structural characteristics of the films. Ellipsometry, in addition, was used to confirm the structural characteristics. The films as deposited resulted mainly polycrystalline and dense, depending on the substrate temperature and on their relative composition. All the films showed n-type conductivity and the films with intermediate compositions resulted in a mixture of both phases; CdO and ZnO. Hall Effect measurements showed that the highest conductivity of CdO was close to 1\times103(\Ω -cm) - 1 , the highest value obtained for CdO, without doping. Impedance spectroscopy confirmed the Hall Effect results, showing that the highly conducting character of CdO influenced dramatically the conductivity of the (ZnO) X (CdO) 1 - Xfilms. In addition, depending on the substrate temperature and on the relative composition of the films, both, the bulk or grains, as well as the grain boundaries properties limit the conductivity in them.

773.1.#.t: Revista Mexicana de Física; Vol 59, No 5 (2013): 403-0

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handle: 0091ce72a16423ad

harvesting_date: 2020-09-23 00:00:00.0

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last_modified: 2020-11-27 00:00:00

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Artículo

Electrical and structural characteristics of spray deposited (ZnO)X-(CdO)1 - X thin films

Alarcón Flores, G.; Vásquez Pérez, B.; Peláez Rodríguez, A.; Villa Garcia, M.; Carmona Téllez, S.; A, J.; Falcon, C.; Aguilar Frutis, M.

Facultad de Ciencias, UNAM, publicado en Revista Mexicana de Física, y cosechado de Revistas UNAM

Licencia de uso

Procedencia del contenido

Entidad o dependencia
Facultad de Ciencias, UNAM
Revista
Repositorio
Contacto
Revistas UNAM. Dirección General de Publicaciones y Fomento Editorial, UNAM en revistas@unam.mx

Cita

Alarcón Flores, G., et al. (2013). Electrical and structural characteristics of spray deposited (ZnO)X-(CdO)1 - X thin films. Revista Mexicana de Física; Vol 59, No 5: 403-0. Recuperado de https://repositorio.unam.mx/contenidos/4107114

Descripción del recurso

Autor(es)
Alarcón Flores, G.; Vásquez Pérez, B.; Peláez Rodríguez, A.; Villa Garcia, M.; Carmona Téllez, S.; A, J.; Falcon, C.; Aguilar Frutis, M.
Tipo
Artículo de Investigación
Área del conocimiento
Físico Matemáticas y Ciencias de la Tierra
Título
Electrical and structural characteristics of spray deposited (ZnO)X-(CdO)1 - X thin films
Fecha
2013-01-01
Resumen
(ZnO) X (CdO) 1 - Xthin films were deposited on glass substrates at 300\∘ C and 400\∘ C by ultrasonic spray pyrolysis with compositions ranging from CdO to ZnO. The electrical properties were obtained by impedance spectroscopy and Hall Effect measurements. Scanning electron microscopy, energy dispersive spectroscopy, and X-ray diffraction, were used to study the structural characteristics of the films. Ellipsometry, in addition, was used to confirm the structural characteristics. The films as deposited resulted mainly polycrystalline and dense, depending on the substrate temperature and on their relative composition. All the films showed n-type conductivity and the films with intermediate compositions resulted in a mixture of both phases; CdO and ZnO. Hall Effect measurements showed that the highest conductivity of CdO was close to 1\times103(\Ω -cm) - 1 , the highest value obtained for CdO, without doping. Impedance spectroscopy confirmed the Hall Effect results, showing that the highly conducting character of CdO influenced dramatically the conductivity of the (ZnO) X (CdO) 1 - Xfilms. In addition, depending on the substrate temperature and on the relative composition of the films, both, the bulk or grains, as well as the grain boundaries properties limit the conductivity in them.
Tema
Impedance spectroscopy; transparent conducting oxides (tcos); spray pyrolysis
Idioma
eng
ISSN
2683-2224 (digital); 0035-001X (impresa)

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