dor_id: 41740

506.#.#.a: Público

590.#.#.d: Los artículos enviados a la Revista Mexicana de Física se someten a un estricto proceso de revisión llevado a cabo por árbitros anónimos, independientes y especializados en todo el mundo.

510.0.#.a: Consejo Nacional de Ciencia y Tecnología (CONACyT), Sistema Regional de Información en Línea para Revistas Científicas de América Latina, el Caribe, España y Portugal (Latindex), Scientific Electronic Library Online (SciELO), SCOPUS, Web Of Science (WoS)

561.#.#.u: http://www.fciencias.unam.mx/

650.#.4.x: Físico Matemáticas y Ciencias de la Tierra

336.#.#.b: info:eu-repo/semantics/article

336.#.#.3: Artículo de Investigación

336.#.#.a: Artículo

351.#.#.6: http://revistas.unam.mx/index.php/rmf

351.#.#.b: Revista Mexicana de Física

351.#.#.a: Artículos

harvesting_group: RevistasUNAM

270.1.#.p: Revistas UNAM. Dirección General de Publicaciones y Fomento Editorial, UNAM en revistas@unam.mx

590.#.#.c: Open Journal Systems (OJS)

270.#.#.d: MX

270.1.#.d: México

590.#.#.b: Concentrador

883.#.#.u: http://www.revistas.unam.mx/front/

883.#.#.a: Revistas UNAM

590.#.#.a: Coordinación de Difusión Cultural

883.#.#.1: http://www.publicaciones.unam.mx/

883.#.#.q: Dirección General de Publicaciones y Fomento Editorial, UNAM

850.#.#.a: Universidad Nacional Autónoma de México

856.4.0.u: http://revistas.unam.mx/index.php/rmf/article/view/30623/28439

100.1.#.a: Martínez, A.; Labbe, F.; Rayas, J. A.; Cordero, R.

524.#.#.a: Martínez, A., et al. (2011). Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry. Revista Mexicana de Física; Vol 57, No 006. Recuperado de https://repositorio.unam.mx/contenidos/41740

245.1.0.a: Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry

502.#.#.c: Universidad Nacional Autónoma de México

561.1.#.a: Facultad de Ciencias, UNAM

264.#.0.c: 2011

264.#.1.c: 2011-01-01

653.#.#.a: Electronic speckle; pattern interferometry; shearography strain

506.1.#.a: La titularidad de los derechos patrimoniales de esta obra pertenece a las instituciones editoras. Su uso se rige por una licencia Creative Commons BY-NC-ND 4.0 Internacional, https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.es, fecha de asignación de la licencia 2011-01-01, para un uso diferente consultar al responsable jurídico del repositorio por medio de rmf@ciencias.unam.mx

884.#.#.k: http://revistas.unam.mx/index.php/rmf/article/view/30623

041.#.7.h: eng

520.3.#.a: In this work, an optical setup that gives the possibility of usingeither ESPI or ESPSI has been implemented to assess in-plane strainsinduced on a composite sample. First, in-plane ESPI was used to measuredisplacement fields, which later allowed us to evaluate thecorresponding strain fields. Next, we applied ESPSI to measure thederivative of in-plane surface displacements (the strains). Theexperimental results obtained by applying both techniques (ESPI andESPSI) were compared. We found that the difference between the strainfields obtained by ESPSI and ESPI was roughly a constant. This resultwas expected since, although ESPI allows computing absolute strainvalues, the strains measured by ESPSI are relative to a reference thatmust be measured using an additional method. Once calibrated the systemESPSI, the ESPI could no longer be used. The strain field obtained inESPSI is corrected by the sum of constant value calculated.

773.1.#.t: Revista Mexicana de Física; Vol 57, No 006 (2011)

773.1.#.o: http://revistas.unam.mx/index.php/rmf

046.#.#.j: 2020-11-25 00:00:00.000000

022.#.#.a: 2683-2224 (digital); 0035-001X (impresa)

310.#.#.a: Bimestral

264.#.1.b: Sociedad Mexicana de Física, A.C.

758.#.#.1: http://revistas.unam.mx/index.php/rmf

handle: 2b770787498e4e4f

harvesting_date: 2020-09-23 00:00:00.0

856.#.0.q: application/pdf

last_modified: 2020-11-27 00:00:00

license_url: https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.es

license_type: by-nc-nd

_deleted_conflicts: 6-97cb18338e21798abe439617a539b896,2-8010b8244982bb57ebd66d84fb59ff5c

No entro en nada

No entro en nada 2

Artículo

Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry

Martínez, A.; Labbe, F.; Rayas, J. A.; Cordero, R.

Facultad de Ciencias, UNAM, publicado en Revista Mexicana de Física, y cosechado de Revistas UNAM

Licencia de uso

Procedencia del contenido

Entidad o dependencia
Facultad de Ciencias, UNAM
Revista
Repositorio
Contacto
Revistas UNAM. Dirección General de Publicaciones y Fomento Editorial, UNAM en revistas@unam.mx

Cita

Martínez, A., et al. (2011). Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry. Revista Mexicana de Física; Vol 57, No 006. Recuperado de https://repositorio.unam.mx/contenidos/41740

Descripción del recurso

Autor(es)
Martínez, A.; Labbe, F.; Rayas, J. A.; Cordero, R.
Tipo
Artículo de Investigación
Área del conocimiento
Físico Matemáticas y Ciencias de la Tierra
Título
Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry
Fecha
2011-01-01
Resumen
In this work, an optical setup that gives the possibility of usingeither ESPI or ESPSI has been implemented to assess in-plane strainsinduced on a composite sample. First, in-plane ESPI was used to measuredisplacement fields, which later allowed us to evaluate thecorresponding strain fields. Next, we applied ESPSI to measure thederivative of in-plane surface displacements (the strains). Theexperimental results obtained by applying both techniques (ESPI andESPSI) were compared. We found that the difference between the strainfields obtained by ESPSI and ESPI was roughly a constant. This resultwas expected since, although ESPI allows computing absolute strainvalues, the strains measured by ESPSI are relative to a reference thatmust be measured using an additional method. Once calibrated the systemESPSI, the ESPI could no longer be used. The strain field obtained inESPSI is corrected by the sum of constant value calculated.
Tema
Electronic speckle; pattern interferometry; shearography strain
Idioma
eng
ISSN
2683-2224 (digital); 0035-001X (impresa)

Enlaces