dor_id: 41560

506.#.#.a: Público

590.#.#.d: Los artículos enviados a la Revista Mexicana de Física se someten a un estricto proceso de revisión llevado a cabo por árbitros anónimos, independientes y especializados en todo el mundo.

510.0.#.a: Consejo Nacional de Ciencia y Tecnología (CONACyT), Sistema Regional de Información en Línea para Revistas Científicas de América Latina, el Caribe, España y Portugal (Latindex), Scientific Electronic Library Online (SciELO), SCOPUS, Web Of Science (WoS)

561.#.#.u: http://www.fciencias.unam.mx/

650.#.4.x: Físico Matemáticas y Ciencias de la Tierra

336.#.#.b: info:eu-repo/semantics/article

336.#.#.3: Artículo de Investigación

336.#.#.a: Artículo

351.#.#.6: http://revistas.unam.mx/index.php/rmf

351.#.#.b: Revista Mexicana de Física

351.#.#.a: Artículos

harvesting_group: RevistasUNAM

270.1.#.p: Revistas UNAM. Dirección General de Publicaciones y Fomento Editorial, UNAM en revistas@unam.mx

590.#.#.c: Open Journal Systems (OJS)

270.#.#.d: MX

270.1.#.d: México

590.#.#.b: Concentrador

883.#.#.u: http://www.revistas.unam.mx/front/

883.#.#.a: Revistas UNAM

590.#.#.a: Coordinación de Difusión Cultural

883.#.#.1: http://www.publicaciones.unam.mx/

883.#.#.q: Dirección General de Publicaciones y Fomento Editorial, UNAM

850.#.#.a: Universidad Nacional Autónoma de México

856.4.0.u: http://revistas.unam.mx/index.php/rmf/article/view/15086/14341

100.1.#.a: Cywiak, M.; Juárez, L.; Flores, J. M.; Servín, M.

524.#.#.a: Cywiak, M., et al. (2009). Bode plots applied to microscopic interferometry. Revista Mexicana de Física; Vol 55, No 005. Recuperado de https://repositorio.unam.mx/contenidos/41560

245.1.0.a: Bode plots applied to microscopic interferometry

502.#.#.c: Universidad Nacional Autónoma de México

561.1.#.a: Facultad de Ciencias, UNAM

264.#.0.c: 2009

264.#.1.c: 2009-01-01

653.#.#.a: Bode transform; gaussian beam; interferometry

506.1.#.a: La titularidad de los derechos patrimoniales de esta obra pertenece a las instituciones editoras. Su uso se rige por una licencia Creative Commons BY-NC-ND 4.0 Internacional, https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.es, fecha de asignación de la licencia 2009-01-01, para un uso diferente consultar al responsable jurídico del repositorio por medio de rmf@ciencias.unam.mx

884.#.#.k: http://revistas.unam.mx/index.php/rmf/article/view/15086

041.#.7.h: eng

520.3.#.a: We describe a technique for using Bode plots in microscopic interferometry, in particular as applied to the three Gaussian beam interferometer recently reported in the literature. The technique is used in a similar manner to its application to an electric or electronic system in finding its frequency response. The Bode response is used to deconvolve the raw data obtained directly from the interferometer to compensate for the data in frequency, making it possible to obtain more realistic profiles of the samples under test. We apply this technique to obtain profiles of the inner reflective layers of two optical types of surfaces for data storage commercially available, namely, the compact disk (CD-R) and the digital versatile disk (DVD-R). We report the experimental results of radial scans of these devices without data marks, before and after applying the transfer function of the system. The measurements are obtained by placing the devices with the polycarbonate surfaces so as to aim the probe beam of the interferometer at them, taking advantage of the vertical depth discrimination of the microscope. We show that the resulting profiles, obtained across the Polycarbonate layer, measured with this interferometer, give valuable information of the real track profiles, making the combination of the Bode plots with this interferometer a suitable tool for quality control of the surface storage devices.

773.1.#.t: Revista Mexicana de Física; Vol 55, No 005 (2009)

773.1.#.o: http://revistas.unam.mx/index.php/rmf

046.#.#.j: 2020-11-25 00:00:00.000000

022.#.#.a: 2683-2224 (digital); 0035-001X (impresa)

310.#.#.a: Bimestral

264.#.1.b: Sociedad Mexicana de Física, A.C.

758.#.#.1: http://revistas.unam.mx/index.php/rmf

handle: 00cf5bf022dd325b

harvesting_date: 2020-09-23 00:00:00.0

856.#.0.q: application/pdf

last_modified: 2020-11-27 00:00:00

license_url: https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.es

license_type: by-nc-nd

_deleted_conflicts: 6-13eec7fe74ea85815c20b540d3fe1d28,2-f1909b99d9eb638ef2a56ed51ef32ba9

No entro en nada

No entro en nada 2

Artículo

Bode plots applied to microscopic interferometry

Cywiak, M.; Juárez, L.; Flores, J. M.; Servín, M.

Facultad de Ciencias, UNAM, publicado en Revista Mexicana de Física, y cosechado de Revistas UNAM

Licencia de uso

Procedencia del contenido

Entidad o dependencia
Facultad de Ciencias, UNAM
Revista
Revista Mexicana de Física
Repositorio
Revistas UNAM
Contacto
Revistas UNAM. Dirección General de Publicaciones y Fomento Editorial, UNAM en revistas@unam.mx

Cita

Cywiak, M., et al. (2009). Bode plots applied to microscopic interferometry. Revista Mexicana de Física; Vol 55, No 005. Recuperado de https://repositorio.unam.mx/contenidos/41560

Descripción del recurso

Autor(es)
Cywiak, M.; Juárez, L.; Flores, J. M.; Servín, M.
Tipo
Artículo de Investigación
Área del conocimiento
Físico Matemáticas y Ciencias de la Tierra
Título
Bode plots applied to microscopic interferometry
Fecha
2009-01-01
Resumen
We describe a technique for using Bode plots in microscopic interferometry, in particular as applied to the three Gaussian beam interferometer recently reported in the literature. The technique is used in a similar manner to its application to an electric or electronic system in finding its frequency response. The Bode response is used to deconvolve the raw data obtained directly from the interferometer to compensate for the data in frequency, making it possible to obtain more realistic profiles of the samples under test. We apply this technique to obtain profiles of the inner reflective layers of two optical types of surfaces for data storage commercially available, namely, the compact disk (CD-R) and the digital versatile disk (DVD-R). We report the experimental results of radial scans of these devices without data marks, before and after applying the transfer function of the system. The measurements are obtained by placing the devices with the polycarbonate surfaces so as to aim the probe beam of the interferometer at them, taking advantage of the vertical depth discrimination of the microscope. We show that the resulting profiles, obtained across the Polycarbonate layer, measured with this interferometer, give valuable information of the real track profiles, making the combination of the Bode plots with this interferometer a suitable tool for quality control of the surface storage devices.
Tema
Bode transform; gaussian beam; interferometry
Idioma
eng
ISSN
2683-2224 (digital); 0035-001X (impresa)

Enlaces